Inspiring Future, Grand Challenge

성균관대학교

Graduate
School
Graduate
School
SKKU
SKKU

 

Research Stories
Research Stories

Research Stories

Detecting Unknown Defects in
Semiconductor Manufacturing Processes
Using Artificial Intelligence

Development of a Semi-Supervised Learning–Based Framework for
Identifying Unknown Defect Patterns on Wafer Bin Maps

Systems Management Engineering Prof. LEE, DONGHEE

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SKKU
SKKU

Research Stories

The Vivid Realism of
AI Deepfakes Undermines
Our Judgement

Deepfakes Identified as the Most Potent Source
of Health-Related Misperceptions

Media & Communication Prof. LEE, JIYOUNG

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Research Stories

  • Detecting Unknown Defects in Semiconductor Manufacturing Processes Using Artificial Intelligence Systems Management Engineering
    Prof. LEE, DONGHEE

    READ MORE
    이동희 교수 연구
  • [Past Contents]

    The Vivid Realism of AI Deepfakes Undermines Our Judgement Media & Communication
    Prof. LEE, JIYOUNG

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    이지영 교수 연구